Metrology - Science and Technology Resource
- Area Detector Systems Corporation - Manufacturer of CCD detectors, particularly in the X-ray range. Includes specifications, certification and technical support from Poway, California.
- Axic, Inc. - Manufactures and distributes semiconductor plasma processing equipment and thin film metrology tools for the semiconductor, III-V compound semiconductor, optics, photonics, optoelectronics, nanotechnology and micro electromechanical system (MEMS) industries. Includes product overview, contacts for technical support, worldwide distribution and location map of Santa Clara, California.
- Cybertechnologies USA - Manufacturer of non-contact laser sensor-based measurement systems for industrial applications in Ogdensburg, New York.
- Dacell Co., Ltd. - Manufactures load cell, torque sensor, pressure sensor, torque wrench, LVDT, multi-layer inclinometer and digital indicator in Chung-Buk, Korea.
- Innova Air Tech Instruments A/S - Manufacturing systems for measurements in anaesthetic gas monitoring, fermentation monitoring, tracer gas, photoacoustic, ventilation and thermal comfort. Includes applications, publications, distribution from Ballerup, Denmark.
- Mettler-Toledo Thermal Analysis - Comprising the differential scanning calorimeter, thermogravimetric, thermomechanical and dynamic mechanical analyzers. Contacts based in Leicester, England.
- Molecular Metrology, Inc. - Designs and manufactures x-ray scattering equipment, including complete instruments for small angle mode and two dimensional detectors. Includes specifications of systems and components, at Northampton, Massachusetts.
- Oxford Microbeams Ltd. - Non-destructive, trace elemental analysis, ion beam analysis using a focused microbeam. Includes applications in tomography and microfabrication, downloads and contacts in England.
- Physical Electronics, Inc. - Surface analysis instrumentation, including: AES, ESCA, TOF-SIMS and D-SIMS based instrumentation.
